Carrier Lifetime Measurement by the Photoconductive Decay Method (Classic Reprint)

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Excerpt from Carrier Lifetime Measurement by the Photoconductive Decay MethodThe authors are indebted to many people at nbs for assistance in carrying out this research. W. E. Phillips and W. M. Bullis provided helpful suggestions throughout the course of the work. The lifetime versus temperature data were taken by F. R. Kelly. The specimen temper ature versus specimen current data were taken by F1 H. Brewer. Fabrica tion assistance was provided by A. W. Stallings. The manuscript was typed at various stages by T. A. Schultz, R. E. Joel, M. L. Stream, and K. E. Dodson.The authors are also indebted to Dr. H. Benda for supplying a pre print of his publication which is referenced herein.About the PublisherForgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.comThis book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully, any imperfections that remain are intentionally left to preserve the state of such historical works.