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  • Digital Hardware Testing: Transistor-Level Fault Modeling and Testing

Digital Hardware Testing: Transistor-Level Fault Modeling and Testing

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Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.
Folgt in ca. 15 Arbeitstagen

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169,00 CHF

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