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- European Test Workshop (Etw 2000) [Postproceedings]
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European Test Workshop (Etw 2000) [Postproceedings]
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The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem
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