Fault Diagnosis of Analog Integrated Circuits

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Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

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Produktinformation

Artikelnummer 9780387257426
Status Lieferbar in ca. 20-45 Arbeitstagen
Autor Kabisatpathy, Prithviraj / Barua, Alok / Sinha, Satyabroto
Einband C, Circuits and Systems, Engineering Design, Electronics and Microelectronics, Instrumentation, Electrical Engineering, Electronic Circuits and Systems, Electrical and Electronic Engineering, engineering, Electronic circuits, Electronics, Microelectronics, Technical design, Electronics engineering, Fester Einband
Sprache eng
Seiten 182
Verlag Springer Nature EN
Reihe Frontiers in Electronic Testing
Publikationsjahr 2005

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