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- ISTFA (TM) 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis
ISTFA (TM) 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis
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Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!
Folgt in ca. 15 Arbeitstagen