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- Residual Stress Measurement by X-Ray Diffraction
Residual Stress Measurement by X-Ray Diffraction
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This editorial review of J784a is based upon decades of experience in the practical application of x-ray diffraction residual stress measurement methods in thousands of individual applications. J784 is a classic document. It serves as the only recognized standard for residual stress measurement available.
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Folgt in ca. 15 Arbeitstagen
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