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  • RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

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The purpose of this book is to introduce engineers and students to modern RF and microwave semiconductor device modelling and measurement techniques used in RF and microwave integrated circuit computer aided design (CAD).
Folgt in ca. 15 Arbeitstagen

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190,00 CHF

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